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Atomic Force Microscope
Atomic force microscope LAFM-A10
Atomic force microscope LAFM-A10
Operation modes Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
Scan angle Random angle
Maximum scan range X/Y axis: 20 µm, Z axis: 2 µm
Optical system/ Magnification of CCD Magnification: 4x, Resolution: 2.5 µm
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm

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Atomic force microscope LAFM-A11
Atomic force microscope LAFM-A11
Operation modes Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
Scan angle 0 to 360°
Maximum scan range X/Y axis: 50 µm, Z axis: 5 µm
Optical system/ Magnification of CCD Magnification: 10x, Resolution: 1 µm
Resolution X/Y axis: 0.2 nm, Z axis: 0.05 nm

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